RU150 | USB 2.0 | USB Flash Drive

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Product Brief

SMART’s DuraFlash RU150 USB 2.0 USB Flash Drives are offered with Single-Level Cell (SLC) NAND flash in capacities of 1GB to 16GB. The USB Memory keys provide enhanced reliability by incorporating onboard error detection and correction, and global Wear-Leveling algorithms that provide reliable operation over a product’s life.

SLC NAND provides superior durability and reliability over Multi-Level Cell (MLC) NAND technology. It is an ideal choice for mission-critical enterprise IT and field service applications.

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Ordering Information

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Part Number

Capacity

Note

SH9MK16GQDU
16GB
C-Temp (0˚C to +70˚C)
SH9MK8GQCU
8GB
C-Temp (0˚C to +70˚C)
SH9MK4GQBU
4GB
C-Temp (0˚C to +70˚C)
SH9MK2GQAU
2GB
C-Temp (0˚C to +70˚C)
SH9MK1GQ9U
1GB
C-Temp (0˚C to +70˚C)

Product Details

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Essentials

Product Series
RU150
NAND Flash Technology
SLC
Interface
USB 2.0

Performance

Sequential Read (maximum)
Up to 34MB/s
Sequential Write (maximum)
Up to 27MB/s
Capacities
1GB 2GB 4GB 8GB 16GB

Reliability

TBW
1GB: 3TBW 2GB: 6TBW 4GB: 12TBW 8GB: 24TBW 16GB: 48TBW
MTBF
>4,000,000 hours

Environmental

Shock
70 in/sec, 3 shocks along each axis, X, Y, Z, in each direction
Vibration
0.9 g rms 10-500 Hz, 30 minutes per side
Operating Temperature
C-temp: 0℃ to +59℃ (plastic part)
Storage Temperature
-40℃ to +85℃
Humidity
5% to 95%, non-condensing, relative humidity

Physical

Length
54.55mm
Width
15.49mm
Height
8.3mm

Technologies

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Advanced Error Detection & Correction
Advanced Error Detection & Correction

SMART’s Advanced Error Detection & Correction technology reinforces the ECC (Error Code Correction) engine and utilizes RAID (Redundant Array of Independent Disks) mechanism. Data is reconstructed by the prior stored parity in other pages. The recovered data will be stored in a new block, and the prior stored block will be refreshed.

Wear-Leveling
Wear-Leveling

Wear-Leveling refers to the practice of ensuring certain NAND blocks aren’t written and erased more often than others. By preventing the overuse of particular blocks which could lead to device failure or data loss, Wear-Leveling therefore improves the life expectancy and endurance of Flash products.

Garbage Collection
Garbage Collection

Flash-based storage devices are different in the way they deal with previously deleted data compared to traditional disks. Data must be erased first before new data can be written to the same block in SSDs. Garbage Collection copies in-use data to a new block, and then deletes all data from the old one.

TRIM Command
TRIM Command

TRIM is a command with the help of which the operating system can tell the SSD which blocks are no longer needed and can be deleted, or are marked as free for rewriting. With the TRIM command, it not only reduces the Write Amplifier Factor (WAF) but also boost the data access speeds.

Over-Provisioning
Over-Provisioning

Over-Provisioning is a technology where a certain portion of the physical capacity of the memory is reserved for carrying out garbage collection, wear-leveling and bad block management. It effectively reduces the attribute of write amplification and extends the lifespan of an SSD.

Solutions

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From small industrial components deployed in automation systems to large equipment used for oil drilling, project operations are asked to provide precise instructions, occasionally in harsh environments. Therefore, it is critical to maintain the accuracy of data output in addition to maintaining continuous, stable operating performance.

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